Today the National Applied Research Laboratories unveiled a breakthrough in wafer testing that could enhance production efficiency by up to 30 times. The lab worked with a private company to develop a testing machine using gas sensor technology. It can test wafers one step earlier compared to the standard testing process, allowing defects to be detected early. Typically a semiconductor wafer has to be packaged before it can be tested, meaning that if defects are detected, the entire wafer must be discarded. NARLabs has teamed up with a private enterprise to develop gas sensor technology that can test a wafer before it is packaged. This new wafer prober can significantly increase production yields and efficiency.Chen Fong-zhiNARLabs The tests we have now are conducted on wafers in the wafer stage. These are electrical tests. Before, we have not had a way to test reactions with gases. This could make the testing process at least 10 times more efficient.This large gas sensor tester could save on manpower and bring down production costs.Hsu Chia-lingEpistar assistant manager So-called mass production relies on speed. If speed increases thirtyfold, costs become 30 times lower.Domestic manufacturers want to keep this cutting-edge technology here in Taiwan. The technology can be applied not only to manufacturing, but also to testing air pollution. Plans are in the works to use the technology in a portable device for the consumer market.
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